APPLYING FULL 2-PORT CAPABILITIES TO A STANDARD MM-WAVE SYSTEM FOR TRL CALIBRATION

被引：0

作者：

HOLLMANN, D ^{[1
]}

BAUMANN, G ^{[1
]}

HIERL, R ^{[1
]}

机构：

[1] STAND ELEKT LORENZ AG, GAAS MM WAVE DESIGN, PFORZHEIM, GERMANY

来源：

MICROWAVE JOURNAL | 1991年 / 34卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A wideband measurement system based on a vector network analyzer is presented, which allows full two-port bidirectional measurements both in the coaxial bands from 45 MHz and in the waveguide bands up to 110 GHz. Using the components of a standard mm-wave system as it is commonly used in many laboratories, a modified low cost configuration has been assembled, which enables the user to take advantage of the TRL calibration technique. The complete measurement setup is described and results confirming the high accuracy of the system are given.

引用

页码：103 / +

页数：1

共 26 条

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MICROWAVE JOURNAL, 1985, 28 (03) : 165 - +
[2] TRL CALIBRATION SHARPENS MM-WAVE WAFER MEASUREMENTS
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