STUDY OF CHARGING AND DISSOCIATION OF SIO2 SURFACES BY AES

被引：152

作者：

CARRIERE, B ^{[1
]}

LANG, B ^{[1
]}

机构：

[1] UNIV LOUIS PASTEUR,MINERAL LAB,F-6700 STRASBOURG,FRANCE

来源：

关键词：

D O I：

10.1016/0039-6028(77)90267-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：209 / 223

页数：15

共 36 条

[1]

AMELIO GF, 1969, STRUCTURE CHEMISTRY

[2] RADIATION EFFECTS IN SILICA AT LOW TEMPERATURES [J].

ARNOLD, GW ;

COMPTON, WD .

PHYSICAL REVIEW, 1959, 116 (04) :802-811

[3] CALCULATION OF OPTICAL PROPERTIES OF AMORPHOUS SIOX MATERIALS [J].

BENNETT, AJ ;

ROTH, LM .

PHYSICAL REVIEW B, 1971, 4 (08) :2686-+

[4]

BURHOP EHS, 1952, AUGER EFFECT OTHER R

[5]

CARRIERE B, 1972, CR ACAD SCI B PHYS, V274, P415

[6]

CARRIERE B, 1973, VACUUM, V22, P485

[7]

CARRIERE B, UNPUBLISHED RESULTS

[8]

CARRIERE B, 1974, SILIC IND, V11, P313

[9]

CARRIERE B, TO BE PUBLISHED

[10] AUGER ELECTRON SPECTROSCOPY [J].

CHANG, CC .