Analytical comparison of sensor signal processing enhancements for NDT synthetic aperture ultrasonic imaging

被引:13
作者
Silverstein, Seth D. [1 ]
Thomas, Lewis J. [1 ]
机构
[1] GE, Corp Res & Dev, Schenectady, NY 12301 USA
关键词
D O I
10.1109/83.210866
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This paper presents the results of a detailed analytical study of the effects of sensor processing techniques on clutter suppression and image enhancement for NDT systems. In the analysis described herein, a relatively simple beamforming/diffraction model is developed for near-field, wide-band, synthetic aperture ultrasonic imaging in NDT systems. The physical model is used to quantitatively evaluate a variety of front-end sensor signal processing tradeoffs for the enhanced detection and sizing of defects. It is shown using statistical microscopic scattering calculations that a combination of increased spatial sampling and rectangular windowing can increase the signal-to-clutter ratio by similar to 10 dB while maintaining crack size resolutions well below future projected specifications. The sensor signal processing image enhancements are demonstrated by the construction of simulated strip-map SAFT (synthetic aperture focusing technique) images of metallic crack defects in the presence of large numbers of randomly distributed clutter (simulated grain boundary) scatterers.
引用
收藏
页码:60 / 67
页数:8
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