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ELECTROTHERMAL VAPORIZATION INDUCTIVELY-COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY FOR THE ANALYSIS OF SOLID SAMPLES - CONTRIBUTION TO INSTRUMENTATION AND METHODOLOGY
被引:39
|作者:
VERREPT, P
[1
]
DAMS, R
[1
]
KURFURST, U
[1
]
机构:
[1] UNIV FULDA,FACHHSCH,D-36039 FULDA,GERMANY
来源:
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY
|
1993年
/
346卷
/
12期
关键词:
D O I:
10.1007/BF00323712
中图分类号:
O65 [分析化学];
学科分类号:
070302 ;
081704 ;
摘要:
A commercially available graphite furnace was modified in order to use it as an electrothermal vaporization device for solid sample analysis with an inductively coupled plasma atomic emission spectrometer. An evaluation of two different ETV systems has been made. This paper mainly describes the different aspects which must be taken into account when coupling an ETV system to an ICP. Cu was chosen as an element easy to determine and Cd and Pb as elements with more difficulties. From the optimization it was found that the transport efficiency for Cd in solution and solid is different, whereas for Cu and Pb the efficiencies are in good agreement for both sample types. Calibration with solids and liquids was attempted for Cu. The paper gives preliminary results on the determination of Cu in solid reference materials. In some cases (e.g. Pb) a background correction based on a linear interpolation seemed not satisfactory. Detection limits and limits of determination for Cu, Cd and Pb in different solid samples are given.
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页码:1035 / 1041
页数:7
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