Annealing atmosphere influence on contact resistivity of ohmic Pd/Ge/Au contact to n-GaAs

被引:5
作者
Mitin, D. M. [1 ]
Soldatenkov, F. Yu. [1 ]
Mozharov, A. M. [2 ]
Vasil'ev, A. A. [2 ]
Neplokh, V. V. [2 ]
Mukhin, I. S. [2 ,3 ]
机构
[1] Russian Acad Sci, Ioffe Phys Tech Inst, Politekhn Skaya, St Petersburg 194021, VA, Russia
[2] Russian Acad Sci, St Petersburg Natl Res Acad Univ, Khlopina,8,Bldg 3,Lit, St Petersburg 194021, Russia
[3] St Petersburg Natl Res Univ Informat Technol Mech, Kronverkskiy,49, St Petersburg 197101, Russia
来源
NANOSYSTEMS-PHYSICS CHEMISTRY MATHEMATICS | 2018年 / 9卷 / 06期
基金
俄罗斯科学基金会;
关键词
GaAs; ohmic contact; contact resistivity; thermal annealing; solid-phase regrowth;
D O I
10.17586/2220-8054-2018-9-6-789-792
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report the results of research for the Pd/Ge/Au ohmic contact resistivity to n-GaAs thermally treated in various gas atmospheres at low temperature. The lowest contact resistivity of about 4 . 10(-6) Omega.cm(2) was obtained with annealing under a hydrogen atmosphere. The mechanism of the ohmic contact formation upon annealing under a hydrogen atmosphere has been proposed. The achieved results can be used for development of multi-junction solar cells, power semiconductor devices, lasers, and nanowire-based structures sensible to a high temperature treatment.
引用
收藏
页码:789 / 792
页数:4
相关论文
共 12 条
[1]   A survey of ohmic contacts to III-V compound semiconductors [J].
Baca, AG ;
Ren, F ;
Zolper, JC ;
Briggs, RD ;
Pearton, SJ .
THIN SOLID FILMS, 1997, 308 :599-606
[2]   CONTACT RESISTANCE AND CONTACT RESISTIVITY [J].
BERGER, HH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1972, 119 (04) :507-&
[3]   Mechanisms of current flow in metal-semiconductor ohmic contacts [J].
Blank, T. V. ;
Gol'dberg, Yu. A. .
SEMICONDUCTORS, 2007, 41 (11) :1263-1292
[4]   On the low resistance Au/Ge/Pd ohmic contact to n-GaAs [J].
Hao, PH ;
Wang, LC ;
Deng, F ;
Lau, SS ;
Cheng, JY .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (08) :4211-4215
[5]   Ohmic contacts to GaAs epitaxial layers [J].
Kim, TJ ;
Holloway, PH .
CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1997, 22 (03) :239-273
[6]   COMPARISON OF AU/NI/GE, AU/PD/GE, AND AU/PT/GE OHMIC CONTACTS TO N-TYPE GAAS [J].
LIN, C ;
LEE, CP .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (01) :260-263
[7]   NONALLOYED OHMIC CONTACTS TO N-GAAS BY SOLID-PHASE EPITAXY OF GE [J].
MARSHALL, ED ;
ZHANG, B ;
WANG, LC ;
JIAO, PF ;
CHEN, WX ;
SAWADA, T ;
LAU, SS ;
KAVANAGH, KL ;
KUECH, TF .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (03) :942-947
[8]   Rectification and Photoconduction Mapping of Axial Metal-Semiconductor Interfaces Embedded in GaAs Nanowires [J].
Orru, Marta ;
Piazza, Vincenzo ;
Rubini, Silvia ;
Roddaro, Stefano .
PHYSICAL REVIEW APPLIED, 2015, 4 (04)
[9]  
[Паханов Николай Андреевич Pakhanov N.A.], 2018, [Автометрия, Optoelectronics, Instrumentation and Data Processing, Avtometriya], V54, P93, DOI 10.15372/AUT20180211
[10]   SOLID-PHASE REGROWTH OF COMPOUND SEMICONDUCTORS BY REACTION-DRIVEN DECOMPOSITION OF INTERMEDIATE PHASES [J].
SANDS, T ;
MARSHALL, ED ;
WANG, LC .
JOURNAL OF MATERIALS RESEARCH, 1988, 3 (05) :914-921