NOVEL HOLOGRAPHIC SHEARING INTERFEROMETER FOR MEASURING LENS LATERAL ABERRATION

被引：18

作者：

MATSUDA, K ^{[1
]}

MINAMI, Y ^{[1
]}

EIJU, T ^{[1
]}

机构：

[1] FUJI PHOTO OPT CO LTD,SAITAMA 330,JAPAN

来源：

APPLIED OPTICS | 1992年 / 31卷 / 31期

关键词：

SHEARING INTERFEROMETRY; HOLOGRAPHY; LATERAL ABERRATION;

D O I：

10.1364/AO.31.006603

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new type of holographic shearing interferometer for measuring lens lateral aberrations is described, In this interferometer a vertical tilt is introduced between the output beams so that the output fringes directly map out the lateral aberration curve of the lens being tested. In addition to this we improve the precision of the interferometer by making it a multiple-beam system through the use of multiple-exposure holograms. The theory of operation of the interferometer is described, and results obtained with an experimental system are presented.

引用

页码：6603 / 6609

页数：7

共 19 条

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