ROUGHNESS DETERMINATION BY SPECKLE WAVELENGTH DECORRELATION

被引：8
|
作者：
SCHERTLER, DJ
GEORGE, N
机构：
[1] The Institute of Optics, University of Rochester, Rochester, NY
来源：
OPTICS LETTERS | 1993年 / 18卷 / 05期
关键词：
D O I：
10.1364/OL.18.000391
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A technique is described for calculating the roughness and probability density function of a surface based on the decorrelation of imaged speckle with wavelength. The decorrelation provides information about the first-order statistical properties of the imaged surface. Surfaces with rms roughnesses of greater than approximately 1 mum can be scanned over the 80-nm range of the dye-laser system.
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页码：391 / 393
页数：3
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