COMPARISON OF SURFACE STEP IMAGES IN REFLECTION ELECTRON-MICROSCOPY AND SCANNING REFLECTION ELECTRON-MICROSCOPY

被引：1

作者：

BANZHOF, H

HERRMANN, KH

机构：

[1] Institute of Applied Physics, University of Tübingen, D-7400 Tübingen

来源：

ULTRAMICROSCOPY | 1990年 / 33卷 / 01期

关键词：

Electron Guns - Surfaces;

D O I：

10.1016/0304-3991(90)90101-Q

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A Philips EM 420 electron microscope equipped with a field emission gun was used to image the same area of a single crystal surface by conventional reflection electron microscopy (REM) and scanning reflection microscopy (SREM). Thus the contrast effects in both imaging can be directly compared. © 1990.

引用

页码：23 / 26

页数：4

共 10 条

[1]

BANZHOF H, 1988, P EUR C ELECTRON MIC, V1, P263

[2]

DABERKOW I, 1988, P EUREM 88, V1, P125

[3] ELECTRON HOLOGRAPHY APPROACHING ATOMIC RESOLUTION [J].