A DEVICE FOR ACCURATE SINGLE-CRYSTAL X-RAY-DIFFRACTION INVESTIGATIONS AT NON-AMBIENT TEMPERATURES - 83-1120-K

被引:15
作者
HONG, SH
ASBRINK, S
机构
关键词
D O I
10.1107/S0021889881008649
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:43 / 50
页数:8
相关论文
共 20 条
[1]  
ARGOUD R, 1977, 4TH EUR CRYST M OXF, P123
[2]   INCREASE OF X-RAY REFLECTION INTENSITIES AND PROFILE WIDTHS AT THE LOW-V3O5 TO HIGH-V3O5 PHASE-TRANSITION STATE [J].
ASBRINK, S ;
HONG, SH .
NATURE, 1979, 279 (5714) :624-625
[3]   THE CRYSTAL-STRUCTURE OF AND VALENCY DISTRIBUTION IN THE LOW-TEMPERATURE MODIFICATION OF V3O5 - THE DECISIVE IMPORTANCE OF A FEW VERY WEAK REFLECTIONS IN A CRYSTAL-STRUCTURE DETERMINATION [J].
ASBRINK, S .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1980, 36 (JUN) :1332-1339
[4]   HIGH-TEMPERATURE APPARATUS FOR ACCURATE SINGLE-CRYSTAL AND POWDER X-RAY STUDIES [J].
BETT, N ;
GLAZER, AM .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (12) :1178-&
[5]  
BROWN GE, 1973, AM MINERAL, V58, P698
[6]  
HONG SH, J CRYST GROWTH
[7]  
HONG SH, 1977, 4TH EUR CRYST M OXF, P575
[8]  
HONG SO, UNPUBLISHED
[10]   A DEVICE FOR TAKING X-RAY PHOTOGRAPHS OF SINGLE CRYSTALS AT HIGH TEMPERATURES [J].
LEFKOWITZ, I ;
MEGAW, HD .
ACTA CRYSTALLOGRAPHICA, 1963, 16 (06) :453-&