A DEVICE FOR ACCURATE SINGLE-CRYSTAL X-RAY-DIFFRACTION INVESTIGATIONS AT NON-AMBIENT TEMPERATURES - 83-1120-K

被引：15

作者：

HONG, SH

ASBRINK, S

机构：

来源：

关键词：

D O I：

10.1107/S0021889881008649

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：43 / 50

页数：8

共 20 条

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[2] INCREASE OF X-RAY REFLECTION INTENSITIES AND PROFILE WIDTHS AT THE LOW-V3O5 TO HIGH-V3O5 PHASE-TRANSITION STATE
ASBRINK, S
HONG, SH
[J]. NATURE, 1979, 279 (5714) : 624 - 625
[3] THE CRYSTAL-STRUCTURE OF AND VALENCY DISTRIBUTION IN THE LOW-TEMPERATURE MODIFICATION OF V3O5 - THE DECISIVE IMPORTANCE OF A FEW VERY WEAK REFLECTIONS IN A CRYSTAL-STRUCTURE DETERMINATION
ASBRINK, S
[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1980, 36 (JUN): : 1332 - 1339
[4] HIGH-TEMPERATURE APPARATUS FOR ACCURATE SINGLE-CRYSTAL AND POWDER X-RAY STUDIES
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[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (12): : 1178 - &
[5] BROWN GE, 1973, AM MINERAL, V58, P698
[6] HONG SH, J CRYST GROWTH
[7] HONG SH, 1977, 4TH EUR CRYST M OXF, P575
[8] HONG SO, UNPUBLISHED
[9] A WEISSENBERG CAMERA FOR USE AT CONSTANT TEMPERATURES BETWEEN ABOUT -150-DEGREES-C. AND 300-DEGREES-C
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[J]. ACTA CRYSTALLOGRAPHICA, 1955, 8 (06): : 348 - 349
[10] A DEVICE FOR TAKING X-RAY PHOTOGRAPHS OF SINGLE CRYSTALS AT HIGH TEMPERATURES
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[J]. ACTA CRYSTALLOGRAPHICA, 1963, 16 (06): : 453 - &