MODELING DEFECT SPATIAL-DISTRIBUTION

[1] BURKILL JC, 1953, LEBESGUE INTEGRAL

[2] Cliff A. D., 1981, SPATIAL PROCESSES MO

[3] On a general class of "contagious" distributions [J]. ANNALS OF MATHEMATICAL STATISTICS, 1943, 14 : 389 - 400

[4] MODELING THE CRITICAL AREA IN YIELD FORECASTS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1985, 20 (04) : 874 - 878

[5] DEFECT ANALYSIS AND YIELD DEGRADATION OF INTEGRATED-CIRCUITS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (03) : 96 - 103

[6] HOROWITZ E, 1981, IEEE T COMPUT, V30, P247, DOI 10.1109/TC.1981.1675772

[7] MEYER FJ, 1988, CTR SATELLITE MODEL

[8] SPATIAL-DISTRIBUTION OF DEFECTS IN SIO2 [J]. ELECTRONICS LETTERS, 1978, 14 (24) : 761 - 762

[9] COST-SIZE OPTIMA OF MONOLITHIC INTEGRATED CIRCUITS [J]. PROCEEDINGS OF THE IEEE, 1964, 52 (12) : 1537 - &

[10] On a new class of "contagious" distributions, applicable in entomology and bacteriology [J]. ANNALS OF MATHEMATICAL STATISTICS, 1939, 10 : 35 - 57

[1] BURKILL JC, 1953, LEBESGUE INTEGRAL

[2] Cliff A. D., 1981, SPATIAL PROCESSES MO

[3] On a general class of "contagious" distributions [J]. ANNALS OF MATHEMATICAL STATISTICS, 1943, 14 : 389 - 400

[4] MODELING THE CRITICAL AREA IN YIELD FORECASTS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1985, 20 (04) : 874 - 878

[5] DEFECT ANALYSIS AND YIELD DEGRADATION OF INTEGRATED-CIRCUITS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (03) : 96 - 103

[6] HOROWITZ E, 1981, IEEE T COMPUT, V30, P247, DOI 10.1109/TC.1981.1675772

[7] MEYER FJ, 1988, CTR SATELLITE MODEL

[8] SPATIAL-DISTRIBUTION OF DEFECTS IN SIO2 [J]. ELECTRONICS LETTERS, 1978, 14 (24) : 761 - 762

[9] COST-SIZE OPTIMA OF MONOLITHIC INTEGRATED CIRCUITS [J]. PROCEEDINGS OF THE IEEE, 1964, 52 (12) : 1537 - &

[10] On a new class of "contagious" distributions, applicable in entomology and bacteriology [J]. ANNALS OF MATHEMATICAL STATISTICS, 1939, 10 : 35 - 57