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IMPROVED TRANSCONDUCTANCE UNDER HIGH NORMAL FIELD IN MOSFETS WITH ULTRATHIN NITRIDED OXIDES
被引:42
作者
:
HORI, T
论文数:
0
引用数:
0
h-index:
0
HORI, T
IWASAKI, H
论文数:
0
引用数:
0
h-index:
0
IWASAKI, H
机构
:
来源
:
IEEE ELECTRON DEVICE LETTERS
|
1989年
/ 10卷
/ 05期
关键词
:
D O I
:
10.1109/55.31718
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:195 / 197
页数:3
相关论文
共 11 条
[1]
GENERALIZED SCALING THEORY AND ITS APPLICATION TO A 1/4 MICROMETER MOSFET DESIGN
BACCARANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
BACCARANI, G
WORDEMAN, MR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
WORDEMAN, MR
DENNARD, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
DENNARD, RH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1984,
31
(04)
: 452
-
462
[2]
INTERFACE STATES AND FIXED CHARGES IN NANOMETER-RANGE THIN NITRIDED OXIDES PREPARED BY RAPID THERMAL ANNEALING
HORI, T
论文数:
0
引用数:
0
h-index:
0
HORI, T
NAITO, Y
论文数:
0
引用数:
0
h-index:
0
NAITO, Y
IWASAKI, H
论文数:
0
引用数:
0
h-index:
0
IWASAKI, H
ESAKI, H
论文数:
0
引用数:
0
h-index:
0
ESAKI, H
[J].
IEEE ELECTRON DEVICE LETTERS,
1986,
7
(12)
: 669
-
671
[3]
ELECTRICAL AND PHYSICAL-PROPERTIES OF ULTRATHIN REOXIDIZED NITRIDED OXIDES PREPARED BY RAPID THERMAL-PROCESSING
HORI, T
论文数:
0
引用数:
0
h-index:
0
HORI, T
IWASAKI, H
论文数:
0
引用数:
0
h-index:
0
IWASAKI, H
TSUJI, K
论文数:
0
引用数:
0
h-index:
0
TSUJI, K
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1989,
36
(02)
: 340
-
350
[4]
IMPROVED HOT-CARRIER IMMUNITY IN SUBMICROMETER MOSFETS WITH REOXIDIZED NITRIDED OXIDES PREPARED BY RAPID THERMAL-PROCESSING
HORI, T
论文数:
0
引用数:
0
h-index:
0
HORI, T
IWASAKI, H
论文数:
0
引用数:
0
h-index:
0
IWASAKI, H
[J].
IEEE ELECTRON DEVICE LETTERS,
1989,
10
(02)
: 64
-
66
[5]
HORI T, 1987, IEDM, P570
[6]
ADVANTAGES OF THERMAL NITRIDE AND NITROXIDE GATE FILMS IN VLSI PROCESS
ITO, T
论文数:
0
引用数:
0
h-index:
0
ITO, T
NAKAMURA, T
论文数:
0
引用数:
0
h-index:
0
NAKAMURA, T
ISHIKAWA, H
论文数:
0
引用数:
0
h-index:
0
ISHIKAWA, H
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
: 498
-
502
[7]
ONG TC, 1987, IEEE T ELECTRON DEV, V34, P2129
[8]
SCHMIDT MA, 1985, DEVICE RES C
[9]
THE EFFECT OF HIGH FIELDS ON MOS DEVICE AND CIRCUIT PERFORMANCE
SODINI, CG
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
SODINI, CG
KO, PK
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
KO, PK
MOLL, JL
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
MOLL, JL
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1984,
31
(10)
: 1386
-
1393
[10]
ELECTRON-MOBILITY IN INVERSION AND ACCUMULATION LAYERS ON THERMALLY OXIDIZED SILICON SURFACES
SUN, SC
论文数:
0
引用数:
0
h-index:
0
SUN, SC
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
PLUMMER, JD
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
: 1497
-
1508
←
1
2
→
共 11 条
[1]
GENERALIZED SCALING THEORY AND ITS APPLICATION TO A 1/4 MICROMETER MOSFET DESIGN
BACCARANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
BACCARANI, G
WORDEMAN, MR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
WORDEMAN, MR
DENNARD, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
DENNARD, RH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1984,
31
(04)
: 452
-
462
[2]
INTERFACE STATES AND FIXED CHARGES IN NANOMETER-RANGE THIN NITRIDED OXIDES PREPARED BY RAPID THERMAL ANNEALING
HORI, T
论文数:
0
引用数:
0
h-index:
0
HORI, T
NAITO, Y
论文数:
0
引用数:
0
h-index:
0
NAITO, Y
IWASAKI, H
论文数:
0
引用数:
0
h-index:
0
IWASAKI, H
ESAKI, H
论文数:
0
引用数:
0
h-index:
0
ESAKI, H
[J].
IEEE ELECTRON DEVICE LETTERS,
1986,
7
(12)
: 669
-
671
[3]
ELECTRICAL AND PHYSICAL-PROPERTIES OF ULTRATHIN REOXIDIZED NITRIDED OXIDES PREPARED BY RAPID THERMAL-PROCESSING
HORI, T
论文数:
0
引用数:
0
h-index:
0
HORI, T
IWASAKI, H
论文数:
0
引用数:
0
h-index:
0
IWASAKI, H
TSUJI, K
论文数:
0
引用数:
0
h-index:
0
TSUJI, K
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1989,
36
(02)
: 340
-
350
[4]
IMPROVED HOT-CARRIER IMMUNITY IN SUBMICROMETER MOSFETS WITH REOXIDIZED NITRIDED OXIDES PREPARED BY RAPID THERMAL-PROCESSING
HORI, T
论文数:
0
引用数:
0
h-index:
0
HORI, T
IWASAKI, H
论文数:
0
引用数:
0
h-index:
0
IWASAKI, H
[J].
IEEE ELECTRON DEVICE LETTERS,
1989,
10
(02)
: 64
-
66
[5]
HORI T, 1987, IEDM, P570
[6]
ADVANTAGES OF THERMAL NITRIDE AND NITROXIDE GATE FILMS IN VLSI PROCESS
ITO, T
论文数:
0
引用数:
0
h-index:
0
ITO, T
NAKAMURA, T
论文数:
0
引用数:
0
h-index:
0
NAKAMURA, T
ISHIKAWA, H
论文数:
0
引用数:
0
h-index:
0
ISHIKAWA, H
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
: 498
-
502
[7]
ONG TC, 1987, IEEE T ELECTRON DEV, V34, P2129
[8]
SCHMIDT MA, 1985, DEVICE RES C
[9]
THE EFFECT OF HIGH FIELDS ON MOS DEVICE AND CIRCUIT PERFORMANCE
SODINI, CG
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
SODINI, CG
KO, PK
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
KO, PK
MOLL, JL
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
MOLL, JL
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1984,
31
(10)
: 1386
-
1393
[10]
ELECTRON-MOBILITY IN INVERSION AND ACCUMULATION LAYERS ON THERMALLY OXIDIZED SILICON SURFACES
SUN, SC
论文数:
0
引用数:
0
h-index:
0
SUN, SC
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
PLUMMER, JD
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
: 1497
-
1508
←
1
2
→