ELECTRON MICROSCOPY OF UO2 - SI02 STRUCTURES AT VARIOUS URANIUM DIOXIDE CONCENTRATIONS

被引：1
作者：
GLANZ, G
TEODORESCU, I
机构：
来源：
JOURNAL OF NUCLEAR MATERIALS | 1970年 / 34卷 / 02期
关键词：
D O I：
10.1016/0022-3115(70)90128-5
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：221 / +
页数：1
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