CONVENTIONAL TRANSMISSION-ELECTRON-MICROSCOPY TECHNIQUES IN CONVERGENT-BEAM ELECTRON-DIFFRACTION

被引：0

|

作者：

TANAKA, M

机构：

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1986年 / 35卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：314 / 323

页数：10

相关论文

共 50 条

[1] Conventional Transmission-Electron-Microscopy Techniques in Convergent-Beam Electron Diffraction
Tanaka, Michiyoshi
1600, Oxford University Press (35):
[2] TECHNIQUES FOR CONVERGENT-BEAM ELECTRON-DIFFRACTION
DOWELL, WCT
GOODMAN, P
JOHNSON, AWS
WILLIAMS, D
ULTRAMICROSCOPY, 1980, 5 (01) : 9 - 18
[3] CONVERGENT-BEAM ELECTRON-DIFFRACTION
TANAKA, M
ACTA CRYSTALLOGRAPHICA SECTION A, 1994, 50 : 261 - 286
[4] CONVERGENT-BEAM ELECTRON-DIFFRACTION
CHERNS, D
JOURNAL DE PHYSIQUE IV, 1993, 3 (C7): : 2113 - 2122
[5] CONVERGENT-BEAM TECHNIQUES IN TRANSMISSION ELECTRON-MICROSCOPY
EADES, JA
APPLIED SURFACE SCIENCE, 1986, 26 (03) : 280 - 293
[6] THERMAL VIBRATIONS IN CONVERGENT-BEAM ELECTRON-DIFFRACTION
LOANE, RF
XU, PR
SILCOX, J
ACTA CRYSTALLOGRAPHICA SECTION A, 1991, 47 : 267 - 278
[7] CHARACTERIZATION OF MATERIALS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION
TANAKA, M
JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (04): : 293 - 293
[8] TRANSLATION SYMMETRIES IN CONVERGENT-BEAM ELECTRON-DIFFRACTION
ISHIZUKA, K
ULTRAMICROSCOPY, 1982, 9 (03) : 255 - 258
[9] ANALYSIS OF CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
TOMOKIYO, Y
JOURNAL OF ELECTRON MICROSCOPY, 1986, 35 (01): : 82 - 82
[10] INVERSION OF CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
BIRD, DM
SAUNDERS, M
ACTA CRYSTALLOGRAPHICA SECTION A, 1992, 48 : 555 - 562

← 1 2 3 4 5 →