RAY-TRACING OF X-RAY FOCUSING CAPILLARIES

被引：16
作者：
CHEN, GJ
CERRINA, F
VOSS, KF
KIM, KH
BROWN, FC
机构：
[1] UNIV WISCONSIN,DEPT ELECT & COMP ENGN,MADISON,WI 53706
[2] UNIV WASHINGTON,DEPT PHYS,SEATTLE,WA 98195
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1994年 / 347卷 / 1-3期
关键词：
D O I：
10.1016/0168-9002(94)91918-6
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We report the use of multi-bounce ray tracing to model single capillaries of various profiles coupled to an Advanced Photon Source insertion-device beamline containing an X-ray monochromator and a toroidal or ellipsoidal focussing mirror. Examples are given for parabolic as well as linear profiles placed at the focussed output of the insertion device beamline for the Pacific Northwest Consortium Collaborative Access Team at the Advanced Photon Source. The implementation of single and multiple capillary simulation is discussed.
引用
收藏
页码：407 / 411
页数：5
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