DETERMINATION OF MINORITY-CARRIER LIFETIME AND SURFACE RECOMBINATION VELOCITY WITH HIGH SPACIAL RESOLUTION

被引：61

作者：

WATANABE, M ^{[1
]}

ACTOR, G ^{[1
]}

GATOS, HC ^{[1
]}

机构：

[1] MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1977年 / 24卷 / 09期

关键词：

D O I：

10.1109/T-ED.1977.18901

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1172 / 1177

页数：6

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