IDENTIFICATION OF ION SPECIES IN COMBINED AUGER-ELECTRON SPECTROSCOPY AND ELECTRON-IMPACT DESORPTION STUDIES

被引:5
|
作者
NISHIJIMA, M [1 ]
MUROTANI, T [1 ]
机构
[1] MITSUBISHI ELECT CORP LTD, CENT RES LAB, AMAGASAKI, HYOGO, JAPAN
关键词
D O I
10.1143/JJAP.12.777
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:777 / 778
页数:2
相关论文
共 50 条
  • [1] COMBINED AUGER-ELECTRON SPECTROSCOPY AND ELECTRON-IMPACT DESORPTION STUDIES OF SILICON SURFACES
    NISHIJIM.M
    MUROTANI, T
    SURFACE SCIENCE, 1972, 32 (02) : 459 - &
  • [2] COMBINED AUGER-ELECTRON SPECTROSCOPY AND ELECTRON-IMPACT DESORPTION STUDIES OF INTERACTIONS OF GASES WITH SILICON SURFACES
    NISHIJIMA, M
    FUJIWARA, K
    MUROTANI, T
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, : 303 - 306
  • [3] AUGER ELECTRON SPECTROSCOPY STUDY OF ELECTRON-IMPACT DESORPTION
    MUSKET, RG
    SURFACE SCIENCE, 1970, 21 (02) : 440 - &
  • [4] AUGER-ELECTRON SPECTROSCOPY (AES) STUDIES OF ARGON ION INDUCED DESORPTION OF CARBON FROM TANTALUM
    PENA, JL
    SURFACE SCIENCE, 1981, 109 (03) : L550 - L554
  • [5] AUGER-ELECTRON SPECTROSCOPY FOR STRUCTURAL STUDIES
    VALERI, S
    DIBONA, A
    RIVISTA DEL NUOVO CIMENTO, 1993, 16 (05): : 1 - 73
  • [6] AUGER-ELECTRON SPECTROSCOPY STUDIES ON TINX
    HAUPT, J
    BAKER, MA
    STROOSNIJDER, MF
    GISSLER, W
    SURFACE AND INTERFACE ANALYSIS, 1994, 22 (1-12) : 167 - 170
  • [7] COMBINED AUGER-ELECTRON SPECTROSCOPY AND SCANNING ELECTRON-MICROSCOPY
    ASHWELL, GWB
    TODD, CJ
    HECKINGBOTTOM, R
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (05): : 435 - 438
  • [8] AUGER-ELECTRON SPECTROSCOPY
    LINSMEIER, C
    VACUUM, 1994, 45 (6-7) : 673 - 690
  • [9] AUGER-ELECTRON SPECTROSCOPY
    KAWAI, T
    DENKI KAGAKU, 1986, 54 (12): : 993 - 995
  • [10] AUGER-ELECTRON SPECTROSCOPY
    BURGGRAF, C
    CARRIERE, B
    GOLDSZTAUB, S
    REVUE DE PHYSIQUE APPLIQUEE, 1976, 11 (01): : 13 - 21