CHARACTERIZATION OF THE RANDOM ARRAY PEAK SIDELOBE

被引：28

作者：

DONVITO, MB ^{[1
]}

KASSAM, SA ^{[1
]}

机构：

[1] UNIV PENN,MOORE SCH ELECT ENGN,DEPT SYST ENGN,PHILADELPHIA,PA 19104

来源：

IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION | 1979年 / 27卷 / 03期

关键词：

D O I：

10.1109/TAP.1979.1142097

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Upper bounds on the height of the peak sidelobe of the random array are derived using the theory of level crossings of a random process. Statistical properties of the random array beam pattern are presented and are used to calculate the expected number of up-crossings of a given level by the power pattern, Upper bounds on the peak sidelobe height are obtained using the expected number of up-crossings. The bounds are compared With computer simulation results. Copyright © 1979 by The Institute of Electrical and Electronics Engineers. Inc.

引用

页码：379 / 385

页数：7

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