SPECTRAL-ANALYSIS OF DEEP LEVEL TRANSIENT SPECTROSCOPY (SADLTS)

被引:38
|
作者
MORIMOTO, J [1 ]
FUDAMOTO, M [1 ]
TAHIRA, K [1 ]
KIDA, T [1 ]
KATO, S [1 ]
MIYAKAWA, T [1 ]
机构
[1] NATL DEF ACAD,DEPT ELECT ENGN,YOKOSUKA,KANAGAWA 239,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1987年 / 26卷 / 10期
关键词
D O I
10.1143/JJAP.26.1634
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1634 / 1640
页数:7
相关论文
共 50 条
  • [1] SPECTRAL ANALYSIS OF DEEP LEVEL TRANSIENT SPECTROSCOPY (SADLTS).
    Morimoto, Jun
    Fudamoto, Michihiro
    Tahira, Kenichiro
    Kida, Tatsuo
    Kato, Seiji
    Miyakawa, Toru
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1987, 26 (10): : 1634 - 1640
  • [2] SPECTRAL-ANALYSIS OF DEEP LEVEL TRANSIENT SPECTROSCOPY (SADLTS) OF DEEP CENTERS IN CDTE SINGLE-CRYSTALS
    MORIMOTO, J
    FUDAMOTO, M
    TASHIRO, S
    ARAI, M
    MIYAKAWA, T
    BUBE, RH
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1988, 27 (12): : 2256 - 2259
  • [3] DISTRIBUTION OF DEEP LEVEL PARAMETERS IN SPECTRAL-ANALYSIS OF DLTS (SADLTS)
    TAHIRA, K
    MORIMOTO, J
    MIYAKAWA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1988, 27 (04): : 556 - 562
  • [4] SPECTRAL-ANALYSIS OF DEEP LEVEL TRANSIENT SPECTROSCOPY (SADLTS) OF DX-CENTERS IN ALXGA1-XAS-SN
    FUDAMOTO, M
    TAHIRA, K
    MORIMOTO, J
    MIYAKAWA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1988, 27 (05): : 738 - 745
  • [5] Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS) of deep centers in CdTe single crystals
    Morimoto, Jun
    Fudamoto, Michihiro
    Tashiro, Shuuji
    Arai, Masaaki
    Miyakawa, Toru
    Bube, Richard H.
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1988, 27 (12): : 2256 - 2259
  • [6] DEEP IMPURITY CENTERS IN CDS SINGLE-CRYSTALS STUDIED BY SPECTRAL-ANALYSIS OF DEEP-LEVEL TRANSIENT SPECTROSCOPY
    YOSHINO, J
    TANAKA, K
    OKAMOTO, Y
    MORIMOTO, J
    MIYAKAWA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (6A): : 3480 - 3481
  • [7] Distribution of deep levels in Si:Au by spectral analysis of deep-level transient spectroscopy
    J. Yoshino
    Y. Okamoto
    J. Morimoto
    T. Miyakawa
    Applied Physics A, 1998, 66 : 323 - 325
  • [8] Distribution of deep levels in Si:Au by spectral analysis of deep-level transient spectroscopy
    Yoshino, J
    Okamoto, Y
    Morimoto, J
    Miyakawa, T
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (03): : 323 - 325
  • [9] SPECTRAL ANALYSIS OF DEEP LEVEL TRANSIENT SPECTORSCOPY (SADLTS) OF DX-CENTERS IN AlXGa1% MIN PLUS X As:Sn.
    Fudamoto, Michihiro
    Tahira, Kenichiro
    Morimoto, Jun
    Miyakawa, Toru
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1988, 27 (05): : 738 - 745
  • [10] Evaluation of interface states in ZnO varistors by spectral analysis of deep level transient spectroscopy
    Ohbuchi, Y
    Yoshino, J
    Okamoto, Y
    Morimoto, J
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (2A): : 899 - 900