ELECTROLUMINESCENCE FROM SULFUR IMPURITIES IN A P-N-JUNCTION FORMED IN EPITAXIAL SILICON

被引:31
作者
BRADFIELD, PL
BROWN, TG
HALL, DG
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D O I
10.1063/1.102115
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O59 [应用物理学];
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页码:100 / 102
页数:3
相关论文
共 17 条
[1]   RADIATIVE DECAY OF EXCITONS BOUND TO CHALCOGEN-RELATED ISOELECTRONIC IMPURITY COMPLEXES IN SILICON [J].
BRADFIELD, PL ;
BROWN, TG ;
HALL, DG .
PHYSICAL REVIEW B, 1988, 38 (05) :3533-3536
[2]   OPTICAL-EMISSION FROM IMPURITIES WITHIN AN EPITAXIAL-SILICON OPTICAL WAVE-GUIDE [J].
BROWN, TG ;
BRADFIELD, PL ;
HALL, DG ;
SOREF, RA .
OPTICS LETTERS, 1987, 12 (09) :753-755
[3]   CONCENTRATION-DEPENDENCE OF OPTICAL-EMISSION FROM SULFUR-DOPED CRYSTALLINE SILICON [J].
BROWN, TG ;
BRADFIELD, PL ;
HALL, DG .
APPLIED PHYSICS LETTERS, 1987, 51 (20) :1585-1587
[4]   OPTICAL-EMISSION AT 1.32-MU-M FROM SULFUR-DOPED CRYSTALLINE SILICON [J].
BROWN, TG ;
HALL, DG .
APPLIED PHYSICS LETTERS, 1986, 49 (05) :245-247
[5]   OBSERVATION OF ELECTROLUMINESCENCE FROM EXCITONS BOUND TO ISOELECTRONIC IMPURITIES IN CRYSTALLINE SILICON [J].
BROWN, TG ;
HALL, DG .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (04) :1399-1401
[6]  
BROWN TG, 1987, THESIS U ROCHESTER
[7]  
BROWN TG, 1986, P SPIE, V704, P38
[8]   1.3-MU-M LIGHT-EMITTING DIODE FROM SILICON ELECTRON-IRRADIATED AT ITS DAMAGE THRESHOLD [J].
CANHAM, LT ;
BARRACLOUGH, KG ;
ROBBINS, DJ .
APPLIED PHYSICS LETTERS, 1987, 51 (19) :1509-1511
[9]  
DEAN PJ, 1986, DEEP CTR SEMICONDUCT, P185
[10]  
EDWARD S, 1978, FUNDAMENTALS SEMICON, pCH6