MICRODEFECTS AND STRIATIONS IN DISLOCATION-FREE LEC-GAP CRYSTALS

被引：22

作者：

DEKOCK, AJR ^{[1
]}

VANDEWIJGERT, WM ^{[1
]}

HENGST, JHT ^{[1
]}

ROKSNOER, PJ ^{[1
]}

HUYBREGTS, JMPL ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

JOURNAL OF CRYSTAL GROWTH | 1977年 / 41卷 / 01期

关键词：

D O I：

10.1016/0022-0248(77)90089-6

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：13 / 28

页数：16

共 50 条

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[50] GROWTH DEFECTS IN S-DOPED LEC-GAP AND DISLOCATION CONFIGURATIONS IN EPITAXIAL LAYERS - TEM OBSERVATION [J].

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