ORGANIC AND ELEMENTAL ION MAPPING USING LASER MASS-SPECTROMETRY

被引:23
作者
WILK, ZA [1 ]
HERCULES, DM [1 ]
机构
[1] UNIV PITTSBURGH,DEPT CHEM,PITTSBURGH,PA 15260
关键词
D O I
10.1021/ac00141a018
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
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页码:1819 / 1825
页数:7
相关论文
共 7 条
[2]   DIRECT DIGITIZATION SYSTEM FOR QUANTIFICATION IN ION MICROSCOPY [J].
FURMAN, BK ;
MORRISON, GH .
ANALYTICAL CHEMISTRY, 1980, 52 (14) :2305-2310
[3]  
FURMAN BK, 1982, SPRINGER SER CHEM PH, V19
[4]   LAMMA-1000, A NEW LASER MICROPROBE MASS ANALYZER FOR BULK SAMPLES [J].
HEINEN, HJ ;
MEIER, S ;
VOGT, H ;
WECHSUNG, R .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 47 (JAN) :19-22
[5]  
MORRISON GH, 1975, ANAL CHEM, V47, pA932, DOI 10.1021/ac60361a006
[6]  
NOVAK F P, 1985, Journal of Trace and Microprobe Techniques, V3, P149
[7]   DOSE-DEPENDENT CESIUM ION-BEAM DAMAGE EFFECTS ON CHEMICALLY MODIFIED POLY(METHYL METHACRYLATE) FILMS USING SECONDARY ION MASS-SPECTROMETRY AND X-RAY PHOTOELECTRON SPECTROSCOPY [J].
SIMKO, SJ ;
GRIFFIS, DP ;
MURRAY, RW ;
LINTON, RW .
ANALYTICAL CHEMISTRY, 1985, 57 (01) :137-142