SEEBECK MEASUREMENTS ON RF SPUTTERED NICKEL-CHROMIUM FILMS

被引：3

|

作者：

WILHELM, RV ^{[1
]}

ROLAND, JP ^{[1
]}

机构：

[1] GM CORP,RES LABS,CTR TECH,DEPT ELETR,WARREN,MI 48090

来源：

JOURNAL OF APPLIED PHYSICS | 1977年 / 48卷 / 05期

关键词：

D O I：

10.1063/1.323923

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：2086 / 2088

页数：3

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