SEEBECK MEASUREMENTS ON RF SPUTTERED NICKEL-CHROMIUM FILMS

被引：3
|
作者：
WILHELM, RV [1 ]
ROLAND, JP [1 ]
机构：
[1] GM CORP,RES LABS,CTR TECH,DEPT ELETR,WARREN,MI 48090
来源：
JOURNAL OF APPLIED PHYSICS | 1977年 / 48卷 / 05期
关键词：
D O I：
10.1063/1.323923
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：2086 / 2088
页数：3
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