PHYSICAL AND MATERIALS LIMITATIONS ON BURNOUT VOLTAGE OF GAAS POWER MESFETS

被引:20
作者
TIWARI, S [1 ]
EASTMAN, LF [1 ]
RATHBUN, L [1 ]
机构
[1] CORNELL UNIV,NATL RES & RESOURCE FACIL SUBMICRON STRUCT,ITHACA,NY 14853
关键词
D O I
10.1109/T-ED.1980.19985
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1045 / 1054
页数:10
相关论文
共 19 条
[1]  
EASTMAN L, UNPUBLISHED
[2]   SUBSTRATE CURRENT IN GAAS-MESFETS [J].
EASTMAN, LF ;
SHUR, MS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (09) :1359-1361
[3]   PROPERTIES OF GALLIUM ARSENIDE DOUBLE-INJECTION DEVICES [J].
FERRO, AP ;
GHANDHI, SK .
JOURNAL OF APPLIED PHYSICS, 1971, 42 (10) :4015-&
[4]   POWER GAAS MESFET WITH A HIGH DRAIN-SOURCE BREAKDOWN VOLTAGE [J].
FUKUTA, M ;
SUYAMA, K ;
SUZUKI, H ;
NAKAYAMA, Y ;
ISHIKAWA, H .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1976, 24 (06) :312-317
[5]   GAAS POWER MESFETS WITH A GRADED RECESS STRUCTURE [J].
FURUTSUKA, T ;
HIGASHISAKA, A ;
AONO, Y ;
TAKAYAMA, Y ;
HASEGAWA, F .
ELECTRONICS LETTERS, 1979, 15 (14) :417-418
[6]   IMPROVEMENT OF DRAIN BREAKDOWN VOLTAGE OF GAAS POWER MESFETS BY A SIMPLE RECESS STRUCTURE [J].
FURUTSUKA, T ;
TSUJI, T ;
HASEGAWA, F .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (06) :563-567
[7]  
GRUBIN HL, UNPUBLISHED
[8]  
JAY PR, 1978, 1978 P INT S GALL AR, V45, P278
[9]   MONTE-CARLO SIMULATION OF SPATIALLY DISTRIBUTED BEAMS IN ELECTRON-BEAM LITHOGRAPHY [J].
KYSER, DF ;
VISWANATHAN, NS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06) :1305-1308
[10]   INTERBAND SCATTERING EFFECTS ON SECONDARY IONIZATION COEFFICIENTS IN GAAS [J].
LAW, HD ;
LEE, CA .
SOLID-STATE ELECTRONICS, 1978, 21 (02) :331-340