X-RAY TOPOGRAPHY SETTINGS - WHITE BEAM TOPOGRAPHY AND DIRECT VIEWING DETECTORS, 2-AXIS SPECTROMETER

被引：18
作者：
SAUVAGE, M
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS | 1978年 / 152卷 / 01期
关键词：
D O I：
10.1016/0029-554X(78)90286-0
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：313 / 317
页数：5
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