NEW SYSTEM FOR MICROWAVE Q-FACTOR MEASUREMENT

被引：1
|
作者：
CULLEN, AL
DAVIES, JA
机构：
来源：
IEE JOURNAL ON MICROWAVES OPTICS AND ACOUSTICS | 1978年 / 2卷 / 03期
关键词：
D O I：
10.1049/ij-moa.1978.0016
中图分类号：
O42 [声学];
学科分类号：
070206 ; 082403 ;
摘要：
引用
收藏
页码：77 / 84
页数：8
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