NEW SYSTEM FOR MICROWAVE Q-FACTOR MEASUREMENT

被引：1

|

作者：

CULLEN, AL

DAVIES, JA

机构：

来源：

IEE JOURNAL ON MICROWAVES OPTICS AND ACOUSTICS | 1978年 / 2卷 / 03期

关键词：

D O I：

10.1049/ij-moa.1978.0016

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

引用

收藏

页码：77 / 84

页数：8

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