IN-SITU MEASUREMENT OF OBJECTIVE LENS DATA OF A HIGH-RESOLUTION ELECTRON MICROSCOPE

被引：0
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作者：
HEINEMANN, K
机构：
来源：
OPTIK | 1971年 / 34卷 / 02期
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中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
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页码：113 / +
页数：1
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