LIFETIME DETERMINATION IN P/N JUNCTION DIODES AND SOLAR-CELLS FROM OPEN-CIRCUIT-VOLTAGE DECAY INCLUDING JUNCTION CAPACITANCE EFFECTS

被引：11
作者：
LIOU, JJ
LINDHOLM, FA
机构：
来源：
SOLID-STATE ELECTRONICS | 1987年 / 30卷 / 04期
关键词：
D O I：
10.1016/0038-1101(87)90176-6
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：457 / 462
页数：6
相关论文
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