A TEST PROGRAM GENERATOR FOR MEMORY-SYSTEMS

被引：0
作者：
SHIH, HJ
KER, JS
KUO, YH
机构：
[1] INST INFORMAT IND,DIV TECHNOL RES,TAIPEI,TAIWAN
[2] NATL CHENG KUNG UNIV,INST INFORMAT ENGN,DEPT ELECT ENGN,TAINAN 70101,TAIWAN
来源：
JOURNAL OF THE CHINESE INSTITUTE OF ENGINEERS | 1994年 / 17卷 / 02期
关键词：
MEMORY SYSTEM TESTING; FAULT DETECTION; FAULT ISOLATION;
D O I：
10.1080/02533839.1994.9677581
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A set of algorithms which can be used to detect and locate the faults in a given memory system, and a test program generator which automatically produces test programs according to the algorithms which are used by the memory system to be tested are developed. Furthermore, a fault simulator designed to simulate the faulty behavior of a memory system has been developed to evaluate the effectiveness of the test program in covering faults. Results showed that a fault coverage near 100% could be achieved.
引用
收藏
页码：179 / 191
页数：13
相关论文
共 11 条
  • [1] ABADIR MS, 1983, COMPUT SURV, V15, P118
  • [2] BHAVSAR D, 1991, IEEE DES TEST COMPUT, P63
  • [3] DIAGNOSIS AND REPAIR OF MEMORY WITH COUPLING FAULTS
    CHANG, MF
    FUCHS, WK
    PATEL, JH
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 1989, 38 (04) : 493 - 500
  • [4] RANDOM PATTERN TESTING VERSUS DETERMINISTIC TESTING OF RAMS
    DAVID, R
    FUENTES, A
    COURTOIS, B
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 1989, 38 (05) : 637 - 650
  • [5] FAULT-DIAGNOSIS OF RAMS FROM RANDOM TESTING EXPERIMENTS
    DAVID, R
    FUENTES, A
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 1990, 39 (02) : 220 - 229
  • [6] DAVIS R, 1983, IEEE COMPUT, P75
  • [7] A REALISTIC FAULT MODEL AND TEST ALGORITHMS FOR STATIC RANDOM-ACCESS MEMORIES
    DEKKER, R
    BEENKER, F
    THIJSSEN, L
    [J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1990, 9 (06) : 567 - 572
  • [8] INCREASED THROUGHPUT FOR THE TESTING AND REPAIR OF RAMS WITH REDUNDANCY
    HADDAD, RW
    DAHBURA, AT
    SHARMA, AB
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 1991, 40 (02) : 154 - 166
  • [9] TESTING FOR COUPLED CELLS IN RANDOM-ACCESS MEMORIES
    SAVIR, J
    MCANNEY, WH
    VECCHIO, SR
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 1991, 40 (10) : 1177 - 1180
  • [10] VANDERGOOR AJ, 1990, ACM COMPUTING SURVEY, V22
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