QUANTITATIVE TRACE ELEMENT ANALYSIS BY CHARGED PARTICLE INDUCED CHARACTERISTIC X-RAYS

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作者：

KRAUSHAAR, JJ

RISTINEN, RA

RUDOLPH, H

SMYTHE, WR

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BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1971年 / 16卷 / 04期

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O4 [物理学];

学科分类号：

0702 ;

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页码：545 / +

页数：1

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