QUANTITATIVE TRACE ELEMENT ANALYSIS BY CHARGED PARTICLE INDUCED CHARACTERISTIC X-RAYS

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作者：
KRAUSHAAR, JJ
RISTINEN, RA
RUDOLPH, H
SMYTHE, WR
机构：
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1971年 / 16卷 / 04期
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O4 [物理学];
学科分类号：
0702 ;
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页码：545 / +
页数：1
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