QUANTITATIVE TRACE ELEMENT ANALYSIS BY CHARGED PARTICLE INDUCED CHARACTERISTIC X-RAYS

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KRAUSHAAR, JJ
RISTINEN, RA
RUDOLPH, H
SMYTHE, WR
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BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1971年 / 16卷 / 04期
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O4 [物理学];
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0702 ;
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页码:545 / +
页数:1
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