FURNACE FOR X-RAY-DIFFRACTION STUDIES OF SINGLE-CRYSTALS

被引：5
|
作者：
LUCAS, BW [1 ]
机构：
[1] UNIV QUEENSLAND, DEPT PHYS, ST LUCIA, 4067 BRISBANE, Qld, AUSTRALIA
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1973年 / 6卷 / 11期
关键词：
D O I：
10.1088/0022-3735/6/11/015
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1097 / 1099
页数：3
相关论文
共 50 条
  • [1] X-RAY-DIFFRACTION STUDIES OF RANDOMLY DISTRIBUTED DISLOCATIONS IN SINGLE-CRYSTALS
    MOLODKIN, VB
    DATSENKO, LI
    KHRUPA, VI
    OSINOVSKII, ME
    KISLOVSKII, EN
    KLADKO, VP
    OSADCHAYA, NV
    PHYSICS OF METALS, 1985, 5 (06): : 1072 - 1083
  • [2] HIGH-TEMPERATURE UNIT FOR X-RAY-DIFFRACTION STUDIES OF SINGLE-CRYSTALS
    ABDULVAKHIDOV, KG
    KUPRIYANOV, MF
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1992, 35 (05) : 942 - 943
  • [3] X-RAY-DIFFRACTION ON SINGLE-CRYSTALS AT HIGH-PRESSURE
    AHSBAHS, H
    PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1987, 14 : 263 - 302
  • [4] A METHOD OF X-RAY-DIFFRACTION INVESTIGATION OF SPLIT SINGLE-CRYSTALS
    FETISOV, GV
    ILYASOVA, NM
    ZHUKOV, SG
    LAKTIONOV, AV
    MARKOV, VT
    KRISTALLOGRAFIYA, 1989, 34 (03): : 602 - 606
  • [5] PRECISION X-RAY-DIFFRACTION INVESTIGATIONS OF SINGLE-CRYSTALS OF HTSCS
    SIMONOV, VI
    USPEKHI FIZICHESKIKH NAUK, 1995, 165 (02): : 221 - 223
  • [6] X-RAY-DIFFRACTION STUDIES ON THE MISORIENTATION OF SUBGRAINS DURING CREEP OF TIN SINGLE-CRYSTALS
    SUH, SH
    COHEN, JB
    WEERTMAN, J
    JOURNAL OF METALS, 1981, 33 (09): : A32 - A32
  • [7] X-RAY-DIFFRACTION STUDIES ON THE MISORIENTATION OF SUBGRAINS DURING CREEP OF TIN SINGLE-CRYSTALS
    SUH, SH
    COHEN, JB
    WEERTMAN, J
    SCRIPTA METALLURGICA, 1981, 15 (05): : 517 - 522
  • [8] OBSERVATION OF SLIP BANDS IN MOLYBDENUM SINGLE-CRYSTALS BY X-RAY-DIFFRACTION
    BOYCE, RF
    VREELAND, T
    MATERIALS SCIENCE AND ENGINEERING, 1972, 9 (01): : 56 - &
  • [9] ANOMALOUS BEHAVIOR OF SILICON SINGLE-CRYSTALS OBSERVED BY X-RAY-DIFFRACTION
    KOHNO, A
    AOMINE, N
    SOEJIMA, Y
    OKAZAKI, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (9A): : 5073 - 5077
  • [10] CHARACTERIZATION OF THIN, DOPED SILICON SINGLE-CRYSTALS BY X-RAY-DIFFRACTION
    JOKSCH, S
    GRAEFF, W
    ZAUMSEIL, P
    WINTER, U
    CSEPREGI, L
    IBERL, F
    FREUND, AK
    JOURNAL OF APPLIED PHYSICS, 1992, 72 (01) : 54 - 60
12345