AUTOMATIC TESTER FOR BALANCED COMMUNICATION CABLES

被引：0
作者：
ABELDT, G
KRUIJEN, B
机构：
来源：
SIEMENS REVIEW | 1978年 / 45卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：261 / 265
页数：5
相关论文
共 50 条
[41]   JCrasher: an automatic robustness tester for Java']Java [J].
Csallner, C ;
Smaragdakis, Y .
SOFTWARE-PRACTICE & EXPERIENCE, 2004, 34 (11) :1025-1050
[42]   AUTOMATIC HARDNESS TESTER SPEEDS QUALITY CONTROL [J].
不详 .
METAL TREATING, 1969, 20 (03) :24-&
[43]   AUTOMATIC RX/TX TESTER SMAT. [J].
Bues, Dieter .
News from Rohde & Schwarz, 1981, 21 (94) :18-20
[44]   SOME OBSERVATIONS ON MILKO-TESTER AUTOMATIC [J].
KENNEDY, BW ;
MOXLEY, JE .
CANADIAN JOURNAL OF ANIMAL SCIENCE, 1974, 54 (02) :261-261
[45]   AUTOMATIC NICKEL CADMIUM BATTERY TESTER. [J].
Waters, T.W. .
Electronic Engineering (London), 1978, 50 (601)
[46]   AUTOMATIC MAGNETO-OPTIC ROTATION TESTER [J].
LENTZ, T ;
MIYATA, J .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (08) :890-&
[47]   Multifunctional Automatic Tester for Optical Storage and Lithography [J].
Fan, Yongtao ;
Xu, Wendong ;
Chenlu ;
Liu, Qian ;
Guo, Chuanfei .
EIGHTH INTERNATIONAL SYMPOSIUM ON OPTICAL STORAGE AND 2008 INTERNATIONAL WORKSHOP ON INFORMATION DATA STORAGE, 2009, 7125
[48]   Automatic probing system for electron beam tester [J].
Teguri, H ;
Okubo, K ;
Ito, A .
MICROELECTRONIC ENGINEERING, 1996, 31 (1-4) :339-346
[49]   Triac tester allows for manual or automatic operation [J].
Raynus, Abel .
EDN, 2009, 54 (16) :39-41
[50]   Television automatic video-line tester [J].
Ge, ZX ;
Tang, DS ;
Feng, BH .
AUTOMATED OPTICAL INSPECTION FOR INDUSTRY: THEORY, TECHNOLOGY, AND APPLICATIONS II, 1998, 3558 :150-154
12345