MECHANICAL-PROPERTIES OF THIN-FILMS

[1] ALECK BJ, 1949, J APPL MECH-T ASME, V16, P118

[2] FIRST REPORT ON DEFORMATION-MECHANISM MAPS [J]. ACTA METALLURGICA, 1972, 20 (07): : 887 - +

[3] BARTHOLOMEUSZ BJ, 1987, SPIE, V821, P1

[4] BHUNSHASH R, 1982, DEPOSITION TECHNOLOG

[5] COMMENTS ON ALECKS STRESS-DISTRIBUTION IN CLAMPED PLATES [J]. JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1981, 48 (02): : 442 - 445

[6] STRAIN DISTRIBUTION IN THIN ALUMINUM FILMS USING X-RAY DEPTH PROFILING [J]. JOURNAL OF APPLIED PHYSICS, 1988, 63 (01) : 126 - 131

[7] MEASUREMENT AND INTERPRETATION OF STRESS IN ALUMINUM-BASED METALLIZATION AS A FUNCTION OF THERMAL HISTORY [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (03) : 689 - 699

[8] FROST HJ, 1987, SPIE82106, P77

[9] FROST HJ, 1973, 2ND REP DEF MECH MAP

[10] IMPROVEMENT IN THE ADHESION OF THIN-FILMS TO SEMICONDUCTORS AND OXIDES USING ELECTRON AND PHOTON IRRADIATION [J]. APPLICATIONS OF SURFACE SCIENCE, 1985, 22-3 (MAY): : 1034 - 1041

[1] ALECK BJ, 1949, J APPL MECH-T ASME, V16, P118

[2] FIRST REPORT ON DEFORMATION-MECHANISM MAPS [J]. ACTA METALLURGICA, 1972, 20 (07): : 887 - +

[3] BARTHOLOMEUSZ BJ, 1987, SPIE, V821, P1

[4] BHUNSHASH R, 1982, DEPOSITION TECHNOLOG

[5] COMMENTS ON ALECKS STRESS-DISTRIBUTION IN CLAMPED PLATES [J]. JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1981, 48 (02): : 442 - 445

[6] STRAIN DISTRIBUTION IN THIN ALUMINUM FILMS USING X-RAY DEPTH PROFILING [J]. JOURNAL OF APPLIED PHYSICS, 1988, 63 (01) : 126 - 131

[7] MEASUREMENT AND INTERPRETATION OF STRESS IN ALUMINUM-BASED METALLIZATION AS A FUNCTION OF THERMAL HISTORY [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (03) : 689 - 699

[8] FROST HJ, 1987, SPIE82106, P77

[9] FROST HJ, 1973, 2ND REP DEF MECH MAP

[10] IMPROVEMENT IN THE ADHESION OF THIN-FILMS TO SEMICONDUCTORS AND OXIDES USING ELECTRON AND PHOTON IRRADIATION [J]. APPLICATIONS OF SURFACE SCIENCE, 1985, 22-3 (MAY): : 1034 - 1041