ANALYSIS OF MULTILAYER THIN-FILM STRUCTURES CONTAINING MAGNETOOPTIC AND ANISOTROPIC MEDIA AT OBLIQUE-INCIDENCE USING 2X2 MATRICES

被引：153

作者：

MANSURIPUR, M

机构：

[1] Optical Sciences Center, University of Arizona, Tucson

来源：

JOURNAL OF APPLIED PHYSICS | 1990年 / 67卷 / 10期

关键词：

D O I：

10.1063/1.345121

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A complete analysis of multilayer structures containing an arbitrary number of dielectric, metal, magnetic, and birefringent/dichroic layers is presented. An algorithm, based on simple 2×2 matrices, is derived which allows reflection, transmission, absorption, magneto-optic conversion, birefringence, and dichroism of the structure to be computed on a personal computer. The incident beam is assumed to be plane monochromatic with arbitrary angle of incidence. There are no approximations involved, and the results are direct consequences of Maxwell's equations.

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页码：6466 / 6475

页数：10

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