RELATIVE TRANSITION-PROBABILITIES FOR THE X-RAY-LINES FROM THE K-LEVEL

被引：28
作者：
HEINRICH, KFJ
FIORI, CE
MYKLEBUST, RL
机构：
[1] Center for Analytical Chemistry, National Bureau of Standards, Washington
来源：
JOURNAL OF APPLIED PHYSICS | 1979年 / 50卷 / 09期
关键词：
D O I：
10.1063/1.326752
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The ratio of emission of the electron-excited Kβ lines to the sum of Kα and Kβ lines was measured for several elements with a lithium-drifted silicon detector. The measured intensities were corrected for background, line overlap, and absorption within the target and within the detector. The results are compared with those obtained by other investigators.
引用
收藏
页码：5589 / 5591
页数：3
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