QUANTITATIVE SURFACE ANALYSIS BY X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：167

作者：

POWELL, CJ ^{[1
]}

LARSON, PE ^{[1
]}

机构：

[1] GCA MCPHERSON INSTRUMENT CORP, ACTON, MA 01720 USA

来源：

APPLIED SURFACE SCIENCE | 1978年 / 1卷 / 02期

关键词：

D O I：

10.1016/0378-5963(78)90014-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：186 / 201

页数：16

共 64 条

[1]

BERENYI D, 1976, ADV ELECTRONICS ELEC, P55

[2] RELATIVE PHOTOELECTRON SIGNAL INTENSITIES OBTAINED WITH A MAGNESIUM X-RAY SOURCE [J].

BERTHOU, H ;

JORGENSEN, CK .

ANALYTICAL CHEMISTRY, 1975, 47 (03) :482-488

[3] X-RAY PHOTOIONIZATION CROSS-SECTIONS FOR QUANTITATIVE-ANALYSIS [J].

BRILLSON, LJ ;

CEASAR, GP .

SURFACE SCIENCE, 1976, 58 (02) :457-468

[4]

BRION D, 1976, J MICROSC SPECT ELEC, V1, P227

[5]

Carlson T. A., 1975, PHOTOELECTRON AUGER

[6] EXPERIMENTAL EVALUATION OF A SIMPLE MODEL FOR QUANTITATIVE-ANALYSIS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

CARTER, WJ ;

SCHWEITZER, GK ;

CARLSON, TA .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :827-835

[7] THEORETICAL STUDY OF INNER-SHELL PHOTOIONIZATION CROSS-SECTIONS AND ANGULAR-DISTRIBUTIONS [J].

CHAPMAN, FM ;

LOHR, LL .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1974, 96 (15) :4731-4739

[8] WIDTHS OF ATOMIC 4S AND 4P VACANCY STATES, 46 LESS THAN OR EQUAL TO Z LESS THAN OR EQUAL TO 50 [J].

CHEN, MH ;

CRASEMANN, B ;

YIN, LI ;

TSANG, T ;

ADLER, I .

PHYSICAL REVIEW A, 1976, 13 (04) :1435-1441

[9] SETHI-ULLMAN ALGORITHM [J].

CHEN, S .

INTERNATIONAL JOURNAL OF COMPUTER MATHEMATICS, 1975, 5 (01) :37-55

[10]

COOPER JW, 1975, ATOMIC INNER SHELL P, V1, P159

← 1 2 3 4 5 6 7 →