LOW-TEMPERATURE ANNEALING OF SHALLOW ARSENIC-IMPLANTED LAYERS

被引:6
作者
YOUNG, ND [1 ]
CLEGG, JB [1 ]
MAYDELLONDRUSZ, EA [1 ]
机构
[1] UNIV SURREY,DEPT ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
关键词
D O I
10.1063/1.337979
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2189 / 2194
页数:6
相关论文
共 33 条
[1]   DEFECTS AND LEAKAGE CURRENTS IN BF2 IMPLANTED PREAMORPHIZED SILICON [J].
BROTHERTON, SD ;
GOWERS, JP ;
YOUNG, ND ;
CLEGG, JB ;
AYRES, JR .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (10) :3567-3575
[2]  
Chu W. K., 1978, BACKSCATTERING SPECT
[3]   REORDERING OF AMORPHOUS LAYERS OF SI IMPLANTED WITH P-31, AS-75, AND B-11 IONS [J].
CSEPREGI, L ;
KENNEDY, EF ;
GALLAGHER, TJ ;
MAYER, JW ;
SIGMON, TW .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (10) :4234-4240
[4]   THE GASEOUS ANODIZATION OF SILICON AND ITS APPLICATIONS [J].
ECCLESTON, W ;
BARLOW, KJ ;
KIERMASZ, A .
VACUUM, 1985, 35 (10-1) :455-458
[5]   DIFFUSION AND PRECIPITATION IN AMORPHOUS SI [J].
ELLIMAN, RG ;
GIBSON, JM ;
JACOBSON, DC ;
POATE, JM ;
WILLIAMS, JS .
APPLIED PHYSICS LETTERS, 1985, 46 (05) :478-480
[6]   DIFFUSION OF ION-IMPLANTED ARSENIC IN SILICON [J].
FAIR, RB ;
TSAI, JCC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (12) :1689-1696
[7]   MODELING RAPID THERMAL-DIFFUSION OF ARSENIC AND BORON IN SILICON [J].
FAIR, RB ;
WORTMAN, JJ ;
LIU, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (10) :2387-2394
[8]  
FAIR RB, 1985, MATER RES SOC S P, V35, P381
[9]   GENERALIZED-MODEL FOR THE CLUSTERING OF AS DOPANTS IN SI [J].
GUERRERO, E ;
POTZL, H ;
TIELERT, R ;
GRASSERBAUER, M ;
STINGEDER, G .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (08) :1826-1831
[10]   CHARACTERISTICS OF RAPID THERMAL ANNEALING IN ION-IMPLANTED SILICON [J].
HOLLAND, OW ;
NARAYAN, J ;
FATHY, D ;
WILSON, SR .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (03) :905-909