SURFACE CHARACTERIZATION OF CERAMIC MEMBRANES BY ATOMIC-FORCE MICROSCOPY

被引：32
|
作者：
BOTTINO, A
CAPANNELLI, G
GROSSO, A
MONTICELLI, O
CAVALLERI, O
ROLANDI, R
SORIA, R
机构：
[1] UNIV GENOA,DIPARTIMENTO FIS,I-16146 GENOA,ITALY
[2] SOC CERAM TECH,F-65460 BAZET,FRANCE
来源：
JOURNAL OF MEMBRANE SCIENCE | 1994年 / 95卷 / 03期
关键词：
ATOMIC FORCE MICROSCOPY; CERAMIC MEMBRANES; SURFACE FEATURES;
D O I：
10.1016/0376-7388(94)00132-4
中图分类号：
TQ [化学工业];
学科分类号：
0817 ;
摘要：
Atomic force microscopy (AFM) has been used to investigate the surface of ultrafiltration and microfiltration ceramic membranes. The AFM has been shown to resolve the feature of the gamma-Al2O3 selective skin layer of ultrafiltration membranes providing information on both the size and shape of the gamma-Al2O3 particles as well as the surface roughness of the skin. When applied to study alpha-Al2O3 microfiltration membranes the AFM has been shown to yield results very similar to those obtained by conventional scanning electron microscopy.
引用
收藏
页码：289 / 296
页数：8
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