STUDY OF THIN CRYSTALLINE FILMS BY UNIVERSAL ELECTRON DIFFRACTION MICROSCOPE

被引：28

|

作者：

HASHIMOTO, H

机构：

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1954年 / 9卷 / 02期

关键词：

D O I：

10.1143/JPSJ.9.150

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：150 / 161

页数：12

相关论文

共 50 条

[1] Feinstrahl Electron Diffraction in the Universal Electron Microscope
von Ardenne, M.
Schiebold, E.
Guenther, F.
ZEITSCHRIFT FUR PHYSIK, 1942, 119 (5-6): : 352 - 365
[2] NOTES ON ELECTRON DIFFRACTION WITH THE UNIVERSAL ELECTRON MICROSCOPE
DUNAWAY, RE
BARTON, HM
JOURNAL OF APPLIED PHYSICS, 1948, 19 (08) : 799 - 800
[3] ELECTRON DIFFRACTION AND MICROSCOPE STUDY OF THIN OXIDE FILMS ON SINGLE CRYSTALS OF ALPHA-IRON
BREWER, EG
SEWELL, PB
COHEN, M
JOURNAL OF APPLIED PHYSICS, 1960, 31 (10) : 1839 - 1839
[4] ELECTRON DIFFRACTION AND ELECTRON MICROSCOPE STUDY OF STRUCTURE OF FILMS OF CONDENSED CARBON
BOIKO, BT
PALATNIK, LS
DEREVYAN.AS
VORONIN, YM
SOVIET PHYSICS SOLID STATE,USSR, 1968, 10 (02): : 520 - +
[5] ELECTRON DIFFRACTION STUDY OF THIN MANGANESE FILMS
LARROQUE, P
LEGROS, B
ALCOUFFE, G
JOURNAL DE MICROSCOPIE, 1968, 7 (04): : A11 - +
[6] AN ELECTRON MICROSCOPE AND DIFFRACTION STUDY OF THE AGING OF EVAPORATED METAL FILMS
SCHEIBNER, EJ
PHYSICAL REVIEW, 1952, 85 (04): : 709 - 710
[7] THE UNIVERSAL ELECTRON MICROSCOPE AS A HIGH RESOLUTION DIFFRACTION CAMERA
PICARD, RG
REISNER, JH
REVIEW OF SCIENTIFIC INSTRUMENTS, 1946, 17 (11): : 484 - 489
[8] ELECTRON DIFFRACTION STUDY OF SOME CRYSTALLINE FILMS ON GERMANIUM SURFACES
OBERLY, JJ
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1961, 108 (03) : C60 - C60
[9] A STUDY OF SPHERULITES AND MINUTE CRYSTALS IN CRYSTALLINE POLYMERS BY MEANS OF THE ELECTRON MICROSCOPE AND ELECTRON DIFFRACTION PATTERNS
KARGUIN, VA
KORETSKAYA, TA
DOKLADY AKADEMII NAUK SSSR, 1956, 110 (06): : 1015 - 1017
[10] MEASURING LOCAL THICKNESS OF AMORPHIC AND CRYSTALLINE THIN-FILMS IN ELECTRON-MICROSCOPE
ILIN, NP
POZHGAI, I
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1977, 41 (11): : 2275 - 2284

← 1 2 3 4 5 →