ELECTRON GUN USING A FIELD EMISSION SOURCE

[1] ACTIVATION ENERGY FOR THE SURFACE MIGRATION OF TUNGSTEN IN THE PRESENCE OF A HIGH-ELECTRIC FIELD [J]. PHYSICAL REVIEW, 1960, 119 (01): : 85 - 93

[2] BROOKSHIER WK, 1961, T NUCL SCI IEEE, VNS12, P104

[3] Butler, 1966, 6TH P INT C EL MICR, V1, P191

[4] SIMPLE METHOD FOR DERIVING, FROM MEASURED I(V) DATA, INFORMATION ON GEOMETRY OF A FIELD EMISSION CURRENT SOURCE OF UNKNOWN CHARACTERISTICS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (05) : 1897 - &

[5] COSSLETT VE, 1954, JUL INT C EL MICR LO, P639

[6] EXPERIMENTS WITH QUADRUPOLE LENSES IN A SCANNING MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) : 4257 - +

[7] SCANNING ELECTRON MICROSCOPES - IS HIGH RESOLUTION POSSIBLE [J]. SCIENCE, 1966, 154 (3750) : 729 - &

[8] THE FIELD EMISSION INITIATED VACUUM ARC .2. THE RESISTIVELY HEATED EMITTER [J]. PHYSICAL REVIEW, 1953, 91 (05): : 1054 - 1057

[9] DRECHSLER M, 1958, 4 P INT C EL MICR BE, P13

[10] Dyke W. P., 1962, ADVAN ELECTRON TUBE, V2, P199

[1] ACTIVATION ENERGY FOR THE SURFACE MIGRATION OF TUNGSTEN IN THE PRESENCE OF A HIGH-ELECTRIC FIELD [J]. PHYSICAL REVIEW, 1960, 119 (01): : 85 - 93

[2] BROOKSHIER WK, 1961, T NUCL SCI IEEE, VNS12, P104

[3] Butler, 1966, 6TH P INT C EL MICR, V1, P191

[4] SIMPLE METHOD FOR DERIVING, FROM MEASURED I(V) DATA, INFORMATION ON GEOMETRY OF A FIELD EMISSION CURRENT SOURCE OF UNKNOWN CHARACTERISTICS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (05) : 1897 - &

[5] COSSLETT VE, 1954, JUL INT C EL MICR LO, P639

[6] EXPERIMENTS WITH QUADRUPOLE LENSES IN A SCANNING MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) : 4257 - +

[7] SCANNING ELECTRON MICROSCOPES - IS HIGH RESOLUTION POSSIBLE [J]. SCIENCE, 1966, 154 (3750) : 729 - &

[8] THE FIELD EMISSION INITIATED VACUUM ARC .2. THE RESISTIVELY HEATED EMITTER [J]. PHYSICAL REVIEW, 1953, 91 (05): : 1054 - 1057

[9] DRECHSLER M, 1958, 4 P INT C EL MICR BE, P13

[10] Dyke W. P., 1962, ADVAN ELECTRON TUBE, V2, P199