STRUCTURAL DEFECTS IN SILICON EPITAXIAL-FILMS AND THEIR INFLUENCE ON ELECTRICAL-PROPERTIES OF PLANAR DIFFUSED P-N-JUNCTIONS

被引：0

作者：

ISKENDERZADE, ZA

MILLER, YG

RZAYEV, SG

JAFAROVA, EA

AKHUNDOV, MR

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来源：

IZVESTIYA AKADEMII NAUK AZERBAIDZHANSKOI SSR SERIYA FIZIKO-TEKHNICHESKIKH I MATEMATICHESKIKH NAUK | 1977年 / 04期

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O1 [数学];

学科分类号：

0701 ; 070101 ;

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页码：76 / 83

页数：8

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[9] STRAIN EFFECTS AROUND PLANAR DIFFUSED STRUCTURES
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