OPTICAL BEAM-DEFLECTION SCANNING FORCE MICROSCOPE WITH EASY CANTILEVER-LASER BEAM ALIGNMENT

被引：0
作者：
SUGIHARA, K
SAKAI, A
MATSUDA, T
TOYOSAKI, M
TANAKA, K
MATSUURA, A
TSUKADA, S
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 02期
关键词：
D O I：
10.1116/1.587400
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：620 / 621
页数：2
相关论文
共 50 条
  • [21] Scanning laser microscope able to detect the refraction of the laser beam
    Mitsui, T
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (5A): : 3279 - 3282
  • [22] The deflection and frequency analysis of micro silicon cantilever beam actuated by electrostatic force
    Hu, GQ
    Chen, GW
    Liu, WY
    [J]. ICO20: MEM, MOEMS, AND NEMS, 2006, 6032
  • [23] Atomic Force Microscopes Employing Laser Beam Deflection for Force Detection
    吴浚瀚
    成英俊
    戴长春
    黄桂珍
    谢有畅
    龚立三
    白春礼
    [J]. ChineseScienceBulletin, 1993, (19) : 1623 - 1625
  • [24] Cross-propagating Beam-Deflection measurements of third-order nonlinear optical susceptibility
    Benis, Sepehr
    Hagan, David J.
    Van Stryland, Eric W.
    [J]. NONLINEAR FREQUENCY GENERATION AND CONVERSION: MATERIALS AND DEVICES XVI, 2017, 10088
  • [25] Transformation of the vortex beam in the optical vortex scanning microscope
    Plociniczak, Lukasz
    Popiolek-Masajada, Agnieszka
    Szatkowski, Mateusz
    Wojnowski, Dariusz
    [J]. OPTICS AND LASER TECHNOLOGY, 2016, 81 : 127 - 136
  • [26] Study on Domain Structure of NaNbO3 Films by Laser beam Scanning Microscope and Piezoresponse Force Microscope
    Yamazoe, Seiji
    Kohori, Akihiro
    Sakurai, Hiroyuki
    Wada, Takahiro
    Kitanaka, Yuuki
    Noguchi, Yuji
    Miyayama, Masaru
    [J]. 2011 INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS (ISAF/PFM) AND 2011 INTERNATIONAL SYMPOSIUM ON PIEZORESPONSE FORCE MICROSCOPY AND NANOSCALE PHENOMENA IN POLAR MATERIALS, 2011,
  • [27] Simultaneous optical detection techniques, interferometry, and optical beam deflection for dynamic mode control of scanning force microscopy
    Univ of Tokyo, Tokyo, Japan
    [J]. J Vac Sci Technol B, 4 (1539-1542):
  • [28] Simultaneous optical detection techniques, interferometry, and optical beam deflection for dynamic mode control of scanning force microscopy
    Hoummady, M
    Farnault, E
    Yahiro, T
    Kawakatsu, H
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (04): : 1539 - 1542
  • [29] A novel beam deflection method for wide angle laser scanning
    Sahba, Kaveh
    Alameh, Kamal E.
    Smith, Clifton L.
    [J]. 2007 THE JOINT INTERNATIONAL CONFERENCE ON OPTICAL INTERNET AND AUSTRALIAN CONFERENCE ON OPTICAL FIBRE TECHNOLOGY, 2007, : 13 - +
  • [30] Optical scanning diagnostic for neutral beam alignment on JET
    Bickley, A.J.
    Jones, T.T.C.
    Norman, T.
    Stork, D.
    Wight, J.
    [J]. Proceedings of the Symposium on Fusion Technology, 1991,
12345