THE SPATIAL-RESOLUTION OF X-RAY-MICROANALYSIS EXPERIMENTAL ASPECTS
被引:0
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作者:
ZELECHOWER, M
论文数: 0引用数: 0
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ZELECHOWER, M
机构:
来源:
INSTITUTE OF PHYSICS CONFERENCE SERIES
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1993年
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130期
关键词:
D O I:
暂无
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
If we try to study extremely small Objects with commercial X-ray microprobe we will face the problem of the spatial resolution of the method. Some factors that determine the minimal volume of X-ray source have been well theoretically described but certain factors concern only a class-of instruments or even an individual instrument (X-rays spatial aberration, take-off angle, quality of crystals). We propose the experimental routine in order to calibrate each individual instrument. The routine employing the convolution technique. can be included to the instrument software package.
机构:
CTR ANALYT ELECTRON MICROSCOPY,ELECTRON MICROSCOPY LAB,2333 AA LEIDEN,NETHERLANDSCTR ANALYT ELECTRON MICROSCOPY,ELECTRON MICROSCOPY LAB,2333 AA LEIDEN,NETHERLANDS