STRUCTURAL AND ELECTRICAL-PROPERTIES OF STABLE NI/CR THIN-FILMS

被引:28
作者
AU, CL
JACKSON, MA
ANDERSON, WA
机构
[1] State Univ of New York at Buffalo,, Amherst, NY, USA, State Univ of New York at Buffalo, Amherst, NY, USA
关键词
D O I
10.1007/BF02653370
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
5
引用
收藏
页码:301 / 306
页数:6
相关论文
共 50 条
[41]   ELECTRICAL-PROPERTIES OF FLASH EVAPORATED THIN-FILMS OF INTE [J].
SASTRY, DVK ;
REDDY, PJ .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 58 (01) :213-218
[42]   ELECTRICAL-PROPERTIES OF POLYCRYSTALLINE-SILICON THIN-FILMS [J].
KAMINS, TI .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (03) :C100-C100
[43]   ELECTRICAL-PROPERTIES OF SELECTIVELY DEPOSITED TUNGSTEN THIN-FILMS [J].
METZ, WA ;
MAHAN, JE ;
MALHOTRA, V ;
MARTIN, TL .
APPLIED PHYSICS LETTERS, 1984, 44 (12) :1139-1141
[44]   ELECTRICAL-PROPERTIES OF AMORPHOUS LITHIUM ELECTROLYTE THIN-FILMS [J].
BATES, JB ;
DUDNEY, NJ ;
GRUZALSKI, GR ;
ZUHR, RA ;
CHOUDHURY, A ;
LUCK, CF ;
ROBERTSON, JD .
SOLID STATE IONICS, 1992, 53 :647-654
[45]   ELECTRICAL-PROPERTIES OF PLASMA-POLYMERIZED THIN-FILMS [J].
PARK, YH ;
TSUTSUMI, H ;
TASAKA, S ;
MIYATA, S .
POLYMER JOURNAL, 1986, 18 (10) :713-718
[46]   LITHIUM ION CONDUCTIVE THIN-FILMS AND THEIR ELECTRICAL-PROPERTIES [J].
MIYAUCHI, K ;
MATSUMOTO, K ;
KANEHORI, K ;
KUDO, T .
DENKI KAGAKU, 1983, 51 (01) :211-212
[47]   STRUCTURAL AND ELECTRICAL-PROPERTIES OF VACUUM-DEPOSITED CUINTE2 THIN-FILMS [J].
KAZMERSKI, LL ;
JUANG, YJ .
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (03) :452-452
[48]   SPECTROSCOPIC, STRUCTURAL, AND ELECTRICAL-PROPERTIES OF LOW-TEMPERATURE SIOXNY INSULATING THIN-FILMS [J].
ANDERSON, GW ;
SCHMIDT, WA ;
COMAS, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (08) :C291-C291
[49]   STRUCTURAL, OPTICAL AND ELECTRICAL-PROPERTIES CHARACTERIZATION OF CDSBTE THIN-FILMS GROWN BY RADIOFREQUENCY SPUTTERING [J].
ALVAREZFREGOSO, O ;
ZELAYAANGEL, O ;
MENDOZAALVAREZ, JG ;
SANCHEZSINENCIO, F ;
FARIAS, MH ;
COTAARAIZA, L .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1995, 56 (01) :117-122
[50]   LASER-ABLATED YBCO THIN-FILMS - RELATIONS BETWEEN STRUCTURAL AND ELECTRICAL-PROPERTIES [J].
ZACH, K ;
BORCK, J ;
LINZEN, S ;
KRAUSSLICH, J ;
SCHMIDL, F ;
SCHNEIDEWIND, H ;
SEIDEL, P .
JOURNAL OF ALLOYS AND COMPOUNDS, 1993, 195 (1-2) :199-202