PERIODICITY IN THICKNESS OF ELECTRON-MICROSCOPE CRYSTAL-LATTICE IMAGES

被引：30

作者：

FEJES, PL ^{[1
]}

IIJIMA, S ^{[1
]}

COWLEY, JM ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1973年 / A 29卷 / NOV1期

关键词：

D O I：

10.1107/S0567739473001737

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：710 / &

共 8 条

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[2] NBEAM LATTICE IMAGES .3. UPPER LIMITS OF IONICITY IN W4NB26O77 [J].

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COWLEY, JM ;

IIJMA, S .

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[5] HIGH-RESOLUTION ELECTRON MICROSCOPY OF CRYSTAL LATTICE OF TITANIUM-NIOBIUM OXIDE [J].

IIJIMA, S .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) :5891-+

[6] DIRECT OBSERVATION OF LATTICE DEFECTS IN H-NB2O5 BY HIGH-RESOLUTION MICROSCOPY [J].

IIJIMA, S .

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1973, 29 (JAN1) :18-+

[7]

IIJIMA S, IN PRESS

[8]

IIJIMA S, 1972, 30 P EL MICR SOC AM, P556

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