CURRENT CHARACTERISTICS FOR THE SCANNING TUNNELING MICROSCOPE

被引:1
|
作者
STAMP, AP
MCINTOSH, GC
LIU, XW
机构
来源
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D O I
10.1116/1.587735
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A theoretical investigation of the characteristics of the tunneling current in the scanning tunneling microscope (STM), taking into account the atomic structure of a nanoprotrusion tip ending in a single atom and nanostructure features of the sample, is presented. The current is determined from the total wave function for the tip-sample system. Scattering theory is used to determine the total wave function in terms of the local Green's functions. Because of the lateral confinement of the electrons by the mesoscopic size of the probing tip, the current through the STM exhibits a Gaussian spatial dependence. It is shown that the constant current mode of operation does not give an accurate description of the topographical features of the potential and hence the surface of the sample.
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页码:2175 / 2178
页数:4
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