TESTING AND DEBUGGING CUSTOM INTEGRATED-CIRCUITS

被引：0

|

作者：

FRANK, EH

SPROULL, RF

机构：

来源：

COMPUTING SURVEYS | 1981年 / 13卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

引用

收藏

页码：425 / 451

页数：27

相关论文

共 50 条

[31] QUALIFICATION, TESTING AND PRELIMINARY TREATMENT OF INTEGRATED-CIRCUITS
BIROLINI, A
F&M-FEINWERKTECHNIK & MESSTECHNIK, 1982, 90 (07): : 347 - 351
[32] TESTING AND PACKAGING OF GAAS DIGITAL INTEGRATED-CIRCUITS
GLOANEC, M
JARRY, J
REVUE TECHNIQUE THOMSON-CSF, 1986, 18 (04): : 695 - 722
[33] PROBLEMS CONNECTED TO THE TESTING OF DIGITAL INTEGRATED-CIRCUITS
FANTINI, F
MORANDI, C
SENIN, A
ELETTROTECNICA, 1984, 71 (05): : 391 - 403
[34] A FRAMEWORK FOR DESIGN AND TESTING OF ANALOG INTEGRATED-CIRCUITS
SOENEN, EG
VANPETEGHEM, PM
LIU, HC
NARAYAN, S
CUMMINGS, JT
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1990, 39 (06) : 890 - 893
[35] ELECTRON-BEAM TESTING OF INTEGRATED-CIRCUITS
REHME, H
PHYSICS IN TECHNOLOGY, 1979, 10 (03): : 97 - 103
[36] ELECTRON AND OPTICAL BEAM TESTING OF INTEGRATED-CIRCUITS
COLLIN, JP
REVUE DE PHYSIQUE APPLIQUEE, 1989, 24 (06): : 129 - 143
[37] ECONOMIC-CONSIDERATIONS OF TESTING INTEGRATED-CIRCUITS
NUTBURN, PG
ELECTRONIC ENGINEERING, 1979, 51 (631): : 143 - 144
[38] INTEGRATED-CIRCUITS
BURSKY, D
ELECTRONIC DESIGN, 1983, 31 (20) : 172 - &
[39] 1983 CUSTOM INTEGRATED-CIRCUITS CONFERENCE TO FOCUS ON APPLICATIONS, DESIGN AUTOMATION
RAPPAPORT, A
EDN MAGAZINE-ELECTRICAL DESIGN NEWS, 1983, 28 (10): : 75 - &
[40] JOINT SPECIAL ISSUE ON DEVICES AND TECHNOLOGIES FOR CUSTOM INTEGRATED-CIRCUITS - FOREWORD
ANAGNOSTOPOULOS, CN
CHAMBERLAIN, SG
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1984, 19 (01) : 3 - 4

← 1 2 3 4 5 →