TESTING AND DEBUGGING CUSTOM INTEGRATED-CIRCUITS

被引：0

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作者：

FRANK, EH

SPROULL, RF

机构：

来源：

COMPUTING SURVEYS | 1981年 / 13卷 / 04期

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D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

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页码：425 / 451

页数：27

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